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EE department, IIT Jodhpur, is organizing a VLSI Test Workshop from 14-16 Feb'2025. The program is intended for the Faculty, UG, and PG students, research scholars, practicing engineers, and people from R & D in the field of VLSI Design. The main objective of the program is to provide the concepts of Design for Testing, Scan based Testing, Scan Compression, Test Standards, Memory Testing, Test Diagnosis, Advanced Fault Modeling, and hands-on sessions using industrial tools.
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The Graduate School on Advanced Sliding Mode Control, sponsored by the International Federation of Automatic Control (IFAC), will be held at IIT Jodhpur from December 5-10, 2024. It provides an opportunity for young researchers and students to participate and interact with leading researchers in the variable structure and sliding mode control.
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Expert Talk by Prof. H.M. Gupta on: Evolution of ICTs: Historical and Indian Context
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Invited Talk by Mr. Tapas Nandy: Cycle of Inter-chip Communication: Past-Present-Future
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