An online webinar is organized on "Introduction and Recent Advances in Atomic Force Microscopy" on 29 June 2020 at 3 pm by Dr. Basavraja S. (Icon Analytical Equipment Pvt. Ltd.) from Park Systems with extensive experience on AFM imaging, troubleshooting and analysis.
From the Speaker:
Atomic force microscopy (AFM) is a one of the most commonly used tools for imaging, manipulating and characterizing materials at nanoscale. Minimal sample preparation, use in ambient conditions, and the ability to image non-conducting specimens at nanoscale make AFM an extremely versatile and useful form of microscopy. But conventional AFMs lack accuracy and repeatability in measuring absolute dimensions. The primary reasons for this matter are the poor behaviour of the piezoelectric tube scanner and the inconsistent tip geometry caused by tip wear. However, the importance of AFM analysis is growing due to the strong necessity to investigate and characterize innovative nanomaterials. To get over the conventional AFM’s limitations, Park Systems has been developing NEW AFM technology over 30 years, and their unique design provides the most accurate information at nanoscale, best repeatability and better productivity. True Non-Contact mode from Park Systems enables researchersto characterize their samples at nanometer resolution without any damage to tip and sample, thereby providing an effective option for imaging.
In this webinar, Basics of AFM, its sample preparation & imaging artifacts will be covered. An offline analysis and interpretation of AFM images using Park XEI offline analysis software will also be explored during the online session.
